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+ new Clock source released up to 20GHz
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Embedded Designer /
Technischer Informatiker
Hardware Programmierer (m/w)
Events 2012 - 2013
DesignCon
Date: 29 Jan - 30 Jan 2013
Santa Clara, USA, Booth 422
Show booth location
Link to DesignCon page...
OFCNFOEC
Date: 19-21 Mar 2013
Anaheim, CA, USA
German Pavillon, Booth 1812
Link to OFCNFOEC page...
Show booth location...
FOE
Date: 10-12 Apr 2013
Tokyo, Japan
German Pavilion
Link to FOE page...
CIOE
Date: 06-09 Sep 2013
Shenzhen, China
German Pavillon
Show booth location 2012...
Link to CIOE page...
ECOC
Date: 23-25 Sep 2013
London, United Kingdom
German Pavillon
Link to ECOC page...
SIMPLY THE BEST !
Market research firm FROST & SULLIVAN recognizes LUCEO Technologies for its Price Performance Value Leadership in the BERT Market.
This global award confirms LUCEO has the best approach of the performance / cost ratio.
LUCEO's modular system in German Quality allows for a fitting feature set without wasting money for unwanted functions.
“Luceo Technologies GmbH is a key market participant in the bit error rate testers (BERT) market. The X-BERT and PARALLEX products are highly competitive in nature and are offered at a very affordable price” says Sujan Sami, Industry Manager, Measurement & Instrumentation, Frost & Sullivan.
Find more details at Frost & Sullivan or Luceo-Press-Releases or 中文.
14G single channel and parallel testing for 16GFC, Infiniband FDR, QSFP, AOC, CFP, CXP and more
Luceo announced the availability of the only reasonable 14G BER test system.
It has configurable channel count from 1 to 4, 10, 12, 24 or whatever is needed.
It can be combined with all other functional modules in the PARALLEX® system.
The latest BERT consists of 2 modules:
Electrical Pattern Generator (click for details)
Electrical Error Detector (click for details)
X-BERT: Single channel BERT with multiple functions (2Gbps - 14.5Gbps)
Smart all-rounder BER Tester
Cost effective BER Tester
Configurable Bit Error Rate Tester with a intuitive and sophisticated graphical user interface. Multiple functional modules around BER testing such as Optical sources, XFP/SFP slot, CDR, Optical Powermeter, Variable optical attenuator, Clock sources and Phase shifters provide a flexible and adequate BER TEST Set.Read more ...
PARALLEX: parallel multi-channel BERT
Multi Channel BER Tester
For any parallel BIT ERROR TEST's
Any required channel count for 40GBASE (4x10G), 100GBASE (10x10G), Infiniband QDR 120G (12x10G), Infiniband FDR 12x14.1G for AOC (Active Optical
Cable), QSFP, CFP, CXP. Phase shifting module allows for alignment of multiple BERT Channels e.g. for cross talk measurement. Each
Bit Error Rate Tester module is able to display errored ones and zeros to
adjust FEC thresholds.
Read more ...
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